Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy: Difference between revisions
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|style="background:LightGrey; color:black"|Tip radius of curvature | |style="background:LightGrey; color:black"|Tip radius of curvature | ||
|style="background:WhiteSmoke; color:black"|Standard probe: <12 nm | |style="background:WhiteSmoke; color:black"|Standard probe: <12 nm | ||
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|style="background:LightGrey; color:black"|Cantilevers/tips vendor | |||
|style="background:WhiteSmoke; color:black"|[http://www.nanoandmore.com/home.php www.nanoandmore.com] | |||
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!style="background:silver; color:black" align="left"|Substrates | !style="background:silver; color:black" align="left"|Substrates | ||
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| style="background:LightGrey; color:black"|Substrate material allowed | | style="background:LightGrey; color:black"|Substrate material allowed | ||
|style="background:WhiteSmoke; color:black"|In principle all materials | |style="background:WhiteSmoke; color:black"|In principle all materials | ||
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!style="background:silver; color:black" align="left"|Software - free | |||
|style="background:LightGrey; color:black"|For visualation and analysis of AFM and Optical profiler files (Nanoman and Sensofar) | |||
|style="background:WhiteSmoke; color:black"|[http://gwyddion.net Gwyddion]" | |||
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