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Specific Process Knowledge/Thin film deposition/Temescal: Difference between revisions

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== Process information ==
== Process information ==


[[/Acceptance Test|Acceptance Test information is found here]]. Describes '''thickness uniformity''' tests, '''side wall deposition''' tests, '''sheet resistance''' tests and tests of the '''ion source''' for substrate cleaning.
[[/Acceptance Test|Acceptance Test information is found here]]. Describes tests of '''thickness uniformity''', '''side wall deposition''', '''sheet resistance''', and '''use of the ion source'''.


===Materials available in the E-beam evaporator (Temescal)===
===Materials available in the E-beam evaporator (Temescal)===