Specific Process Knowledge/Etch/DRIE-Pegasus/processD: Difference between revisions
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{| border="2" cellpadding="2" cellspacing="1" style="text-align:center;" | {| border="2" cellpadding="2" cellspacing="1" style="text-align:center;" | ||
|+ '''Process | |+ '''Process D specifications''' | ||
|- | |- | ||
! Parameter | ! Parameter | ||
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! Etch rate (µm/min) | ! Etch rate (µm/min) | ||
| Not specified | | Not specified | ||
| | | 2.88 | ||
|- | |- | ||
! Etched depth (µm) | ! Etched depth (µm) | ||
| | | 20-30 | ||
| | | 28.75 | ||
|- | |- | ||
! Scallop size (nm) | ! Scallop size (nm) | ||
| < | | < 30 | ||
| | | 46 | ||
|- | |- | ||
! Profile (degs) | ! Profile (degs) | ||
| | | 85 +/- 5 | ||
| | | 89.7 | ||
|- | |- | ||
! Selectivity to AZ photoresist | ! Selectivity to AZ photoresist | ||
| | | Not specified | ||
| | | 50 | ||
|- | |- | ||
! Undercut ( | ! Undercut (nm) | ||
| | | Not specified | ||
| | | 65 | ||
|- | |- | ||
! Uniformity (%) | ! Uniformity (%) | ||
| < 3.5 | | < 3.5 | ||
| | | 4.56-0.25 | ||
|- | |- | ||
! Repeatability (%) | ! Repeatability (%) | ||
| <4 | | <4 | ||
| | | | ||
|- | |- | ||
|} | |} |
Revision as of 13:19, 5 July 2011
Parameter | Specification | Average result |
---|---|---|
Etch rate (µm/min) | Not specified | 2.88 |
Etched depth (µm) | 20-30 | 28.75 |
Scallop size (nm) | < 30 | 46 |
Profile (degs) | 85 +/- 5 | 89.7 |
Selectivity to AZ photoresist | Not specified | 50 |
Undercut (nm) | Not specified | 65 |
Uniformity (%) | < 3.5 | 4.56-0.25 |
Repeatability (%) | <4 |
Main etch (D->E) | Etch | Dep |
---|---|---|
Gas flow (sccm) | SF6 275 O2 5 | C4F8 150 |
Cycle time (secs) | 2.4 | 2.0 |
Pressure (mtorr) | 26 | 20 |
Coil power (W) | 2500 | 2000 |
Platen power (W) | 35 | 0 |
Cycles | 110 (process time 08:04) | |
Common | Temperature 0 degs, HBC 10 torr, Long funnel, with baffle & 100 mm spacers |