Specific Process Knowledge/Etch/DRIE-Pegasus/processC: Difference between revisions

From LabAdviser
Jml (talk | contribs)
No edit summary
Jml (talk | contribs)
No edit summary
Line 8: Line 8:


{| border="2" cellpadding="2" cellspacing="1" style="text-align:center;"
{| border="2" cellpadding="2" cellspacing="1" style="text-align:center;"
|+ '''Process A specifications'''
|+ '''Process C specifications'''
|-
|-
! Parameter
! Parameter
Line 52: Line 52:


{| border="2" cellpadding="2" cellspacing="1" style="text-align:center;"
{| border="2" cellpadding="2" cellspacing="1" style="text-align:center;"
|+ '''Process A recipe'''
|+ '''Process C recipe'''
|-
!
! colspan="2" | Step 1
! colspan="2" | Step 2
|-
|-
! width="120" | Parameter   
! width="120" | Parameter   
! width="120" | Etch
! width="120" | Etch
! width="120" | Dep
! width="120" | Etch
! width="120" | Dep
|-
|-
! Gas flow (sccm)  
! Gas flow (sccm)  
| SF<sub>6</sub> 350 (1.5 s) 550
| SF<sub>6</sub> 38 C<sub>4</sub>F<sub>8</sub> 70
| C<sub>4</sub>F<sub>8</sub> 200
| SF<sub>6</sub> 350 (1.5 s) 550
| C<sub>4</sub>F<sub>8</sub> 200
|-
|-
! Cycle time (secs)  
! Process time (mm:ss)  
| 7.0
| 01:30
| 4.0
| 7.0
| 4.0
|-
|-
! Pressure (mtorr)  
! Pressure (mtorr)  
| 25 (1.5 s) 90 >> 150
| 4
| 25
| 25 (1.5 s) 150
| 25
|-
|-
! Coil power (W)  
! Coil power (W)  
| 2800
| 450
| 2000
| 2800
| 2000
|-
|-
! Platen power (W)
! Platen power (W)
| 120 >> 140 (1.5) 45
| 100
| 0
| 140 (1.5) 45
| 0
|-
! Cycles 
| colspan="2" | 11 (keep fixed)
| colspan="2" | 44 (vary this)
|-
|-
! Common  
! Common  
| colspan="4" | Temperature 20 degs, HBC 10 torr, Short funnel, with baffle & 5mm spacers
| colspan="4" | Temperature 10 degs, HBC 10 torr, long funnel, with baffle & 100 mm spacers
|}
|}

Revision as of 11:43, 5 July 2011

The 100 mm wafers had an Al mask made by lift-off:

  1. 80 nm of spin coated ZEP520A E-beam resist
  2. Patterned by E-beam lithograph
  3. 20 nm Al deposited and patterned by lift-off
  4. ~ 99 % etch load


Process C specifications
Parameter Specification Average result
Etch rate (µm/min) Not specified
Etched depth (µm) 300
Scallop size (nm) < 30
Profile (degs) 85 +/- 5
Selectivity to resist Not speicified
Undercut (nm) < 30
Uniformity (%) < 3.5
Repeatability (%) <4



Process C recipe
Parameter Etch
Gas flow (sccm) SF6 38 C4F8 70
Process time (mm:ss) 01:30
Pressure (mtorr) 4
Coil power (W) 450
Platen power (W) 100
Common Temperature 10 degs, HBC 10 torr, long funnel, with baffle & 100 mm spacers