Specific Process Knowledge/Thin film deposition/Electroplating-Ni: Difference between revisions
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Uniformity across a 4" wafer is around 5% for the standard processes (the edge being slightly thicker than the center of the sample). Running at high current densities will deposit a nickel layer that is quite soft. Decreasing current density will increase tensile strength of the deposited nickel. | Uniformity across a 4" wafer is around 5% for the standard processes (the edge being slightly thicker than the center of the sample). Running at high current densities will deposit a nickel layer that is quite soft. Decreasing current density will increase tensile strength of the deposited nickel. | ||
==Equipment performance and process related parameters== | ==Equipment performance and process related parameters== | ||