Specific Process Knowledge/Characterization/Dektak XTA: Difference between revisions
Created page with "==Dektak XTA stylus profiler== The Dektak XTA stylus profiler from Brüker is used for profiling surfaces of samples with structures in the micro- and nanometer range. The size of the structures that can be measured is limited by the tip dimensions. A profile measurement can be done across a specific structure by using a high magnification camera to locate the structure. It is also possible to program the stylus to measure in several positions, defined with respect to..." |
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==Dektak XTA | {{cc-nanolab} | ||
'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/Specific_Process_Knowledge/Characterization/Dektak XTA click here]''' | |||
=Dektak XTA Stylus Profiler= | |||
The Dektak XTA stylus profiler from Brüker is used for profiling surfaces of samples with structures in the micro- and nanometer range. The size of the structures that can be measured is limited by the tip dimensions. | The Dektak XTA stylus profiler from Brüker is used for profiling surfaces of samples with structures in the micro- and nanometer range. The size of the structures that can be measured is limited by the tip dimensions. | ||
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The user manual, quality control procedure and results, technical information and contact information can be found in [http://labmanager.danchip.dtu.dk/function.php?module=Machine&view=view&mach=304 '''LabManager''']. | |||
[http://labmanager.danchip.dtu.dk/function.php?module=Machine&view=view&mach=304 | |||
Info about measurement accuracy can be found [[/Stylus profiler measurement uncertainty|here]]. | Info about measurement accuracy can be found [[/Stylus profiler measurement uncertainty|here]]. | ||