Specific Process Knowledge/Etch/DRIE-Pegasus/nanoetch/nano142-pxnano2: Difference between revisions

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! colspan="2"| Tool
! colspan="2"| Tool
| Pegasus
| Pegasus
| colspan="2" | ASE
| colspan="2" align="center"| ASE
|-
|-
! rowspan="6" align="center"| Parameters
! rowspan="6" align="center"| Parameters
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| Conditioning
| Conditioning
| Sequence: Oxygen clean, MU tests, processes, no oxygen between runs
| Sequence: Oxygen clean, MU tests, processes, no oxygen between runs
| colspan="2" | none
|-
|-
| Mask
| Mask
| 211 nm zep etched down to 82 nm
| 211 nm zep etched down to 80 nm
| colspan="2" | 211 nm zep etched down to 130 nm
|-  
|-  
|}
|}

Revision as of 10:42, 23 May 2011

nano1.42 versus pxnano2

Recipe nano1.42 pxnano2
Tool Pegasus ASE
Parameters Gas C4F8 75 sccm, SF6 38 sccm D: C4F8 50 sccm, SF6 50 sccm E: SF6 50 sccm
Power 800 W CP, 40 W PP D: 500 W CP E: 350 W CP, 30 W PP
Pressure 4 mTorr, Strike 3 secs @ 15 mTorr 10 mTorr
Temperature -20 degs 20 degrees
Hardware 100 mm Spacers ?
Time 120 secs D: 3 secs, E: 5 secs, total 12 cycles, 96 secs
Conditions Run ID 2150 wf_2e09b_mar23
Conditioning Sequence: Oxygen clean, MU tests, processes, no oxygen between runs none
Mask 211 nm zep etched down to 80 nm 211 nm zep etched down to 130 nm