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Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy: Difference between revisions

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NLAB-Employees-701, NLAB-LabmanagerAllUsers
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m →Tip Wear: Minor Layout changes
Jesyup (talk | contribs)
NLAB-Employees-701, NLAB-LabmanagerAllUsers
24 edits
Line 220: Line 220:
* Size: 1µm  
* Size: 1µm  
* Scan Speed: 1Hz  
* Scan Speed: 1Hz  
* Samples/line: 256
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* Scan mode: PeakForce Tapping
* Scan mode: PeakForce Tapping
Line 225: Line 226:
* Size: 1µm  
* Size: 1µm  
* Scan Speed: 1Hz  
* Scan Speed: 1Hz  
* Samples/line: 256
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|-
! Roughness information
! Roughness information
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