LabAdviser/314/Microscopy 314-307/SEM: Difference between revisions
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''This section is written by DTU Nanolab internal if nothing else is stated.'' | ''This section is written by DTU Nanolab internal if nothing else is stated.'' | ||
[[Category:314]] | [[index.php?title=Category:314]] | ||
[[Category:314-Microscopy]] | [[index.php?title=Category:314-Microscopy]] | ||
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Scanning Electron Microscopy (SEM) is a technique, where a focused beam of accelerated electrons is scanning over a sample. Electrons which are backscattered or secondary generated electrons are collected on a detector. Depending on the type of detector, different signals and sample characteristics can be acquired. The electron beam is steered by electromagnetic lenses. | Scanning Electron Microscopy (SEM) is a technique, where a focused beam of accelerated electrons is scanning over a sample. Electrons which are backscattered or secondary generated electrons are collected on a detector. Depending on the type of detector, different signals and sample characteristics can be acquired. The electron beam is steered by electromagnetic lenses. | ||
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We have five SEMs available at DTU Nanolab in building 314/307. Click on the instrument to find more information about the equipment and available techniques: | |||
We have five SEMs available at DTU Nanolab in building 314. Click on the instrument to find more information about the equipment and available techniques: | |||
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