Specific Process Knowledge/Thermal Process/Oxidation: Difference between revisions
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|Dry and wet oxidation of 100 mm and 150 mm wafers. Oxidation of new wafers without RCA cleaning. Oxidation and annealing of wafers from the LPCVD furnaces and PECVD4. | |Dry and wet oxidation of 100 mm and 150 mm wafers. Oxidation of new wafers without RCA cleaning. Oxidation and annealing of wafers from the LPCVD furnaces and PECVD4. | ||
|Dry and wet oxidation and annealing of wafers from Wafer Bonder 02 and from PECVD4 and PECVD3. | |Dry and wet oxidation and annealing of wafers from Wafer Bonder 02 and from PECVD4 and PECVD3. | ||
| | |Pyrolysis of different resists, annealing in N<sub>2</sub>, dry oxidation of silicon | ||
|Rapid thermal processing: RTA (annealing), RTO (oxidation), RTN (nitridation) and RTH (hydrogenation). | |Rapid thermal processing: RTA (annealing), RTO (oxidation), RTN (nitridation) and RTH (hydrogenation). | ||
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*N<sub>2</sub> | *N<sub>2</sub> | ||
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*Ar | *Ar | ||
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*900 <sup>o</sup>C - 1150 <sup>o</sup>C | *900 <sup>o</sup>C - 1150 <sup>o</sup>C | ||
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* | *25 <sup>o</sup>C - 1050 <sup>o</sup>C, max 3 hours at 1050 <sup>o</sup>C | ||
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*700 <sup>o</sup>C - 1200 <sup>o</sup>C | *700 <sup>o</sup>C - 1200 <sup>o</sup>C | ||
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*1-30 100 mm wafers | *1-30 100 mm wafers | ||
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*1-30 50 mm, 100 mm or 150 mm wafers | *1-30 50 mm, 100 mm or 150 mm wafers per run | ||
* | *Smaller samples (placed on a Si carrier wafer) | ||
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*Single-wafer process | *Single-wafer process | ||
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*All processed wafers have to be RCA cleaned, except for wafers from Wafer Bonder 02 and from PECVD4 and PECVD3. | *All processed wafers have to be RCA cleaned, except for wafers from Wafer Bonder 02 and from PECVD4 and PECVD3. | ||
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* | *Only samples for resist pyrolysis, and all sample materials have to be approved by DTU Nanolab. Samples with metals and III-V materials are NOT allowed | ||
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*Silicon | *Silicon | ||