Specific Process Knowledge/Etch/ICP Metal Etcher: Difference between revisions
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![[Specific Process Knowledge/Etch/ICP Metal Etcher/Sinano36|Sinano3.6]] | ![[Specific Process Knowledge/Etch/ICP Metal Etcher/Sinano36|Sinano3.6]] | ||
![[Specific Process Knowledge/Etch/ICP Metal Etcher/Sinan33-2|Sinano3.3]] | ![[Specific Process Knowledge/Etch/ICP Metal Etcher/Sinan33-2|Sinano3.3]] | ||
![[Specific Process Knowledge/Etch/ICP Metal Etcher/Sinan37|Sinano3.7]] | |||
! | |||
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|- | |- | ||
!Cl<sub>2</sub> (sccm) | !Cl<sub>2</sub> (sccm) | ||
Line 39: | Line 29: | ||
|15 | |15 | ||
|0 | |0 | ||
| | |||
|- | |- | ||
!BCl<sub>3</sub> (sccm) | !BCl<sub>3</sub> (sccm) | ||
Line 50: | Line 41: | ||
|5 | |5 | ||
|5 | |5 | ||
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|- | |- | ||
!HBr (sccm) | !HBr (sccm) | ||
Line 61: | Line 53: | ||
|0 | |0 | ||
|15 | |15 | ||
| | |||
|- | |- | ||
! Coil power (W) | ! Coil power (W) | ||
Line 72: | Line 65: | ||
|900 (Forward) | |900 (Forward) | ||
|900 (Forward) | |900 (Forward) | ||
| | |||
|- | |- | ||
!Platen power (W) | !Platen power (W) | ||
Line 83: | Line 77: | ||
|60 | |60 | ||
|75 | |75 | ||
| | |||
|- | |- | ||
! Pressure (mtorr) | ! Pressure (mtorr) | ||
Line 94: | Line 89: | ||
|10 | |10 | ||
|2 | |2 | ||
| | |||
|- | |- | ||
|- | |- | ||
Line 106: | Line 102: | ||
|180 | |180 | ||
|300 | |300 | ||
| | |||
|- | |- | ||
! Nominal line width | ! Nominal line width | ||
! colspan=" | ! colspan="10" align="center"| Etched depths (nm) | ||
|- | |- | ||
! 30 nm | ! 30 nm | ||
Line 120: | Line 117: | ||
|170 | |170 | ||
|295 | |295 | ||
| | |||
|- | |- | ||
!60 nm | !60 nm | ||
Line 131: | Line 129: | ||
|185 | |185 | ||
|411 | |411 | ||
| | |||
|- | |- | ||
!90 nm | !90 nm | ||
Line 142: | Line 141: | ||
|253 | |253 | ||
|566 | |566 | ||
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|- | |- | ||
!120 nm | !120 nm | ||
Line 164: | Line 164: | ||
|280 | |280 | ||
|647 | |647 | ||
| | |||
|- | |- | ||
! Nominal line width | ! Nominal line width | ||
! colspan=" | ! colspan="10" align="center"| Etch rates in trenches (nm/min) | ||
|- | |- | ||
!30 nm | !30 nm | ||
Line 178: | Line 179: | ||
|57 | |57 | ||
|59 | |59 | ||
| | |||
|- | |- | ||
!60 nm | !60 nm | ||
Line 189: | Line 191: | ||
|62 | |62 | ||
|82 | |82 | ||
| | |||
|- | |- | ||
!90 nm | !90 nm | ||
Line 200: | Line 203: | ||
|84 | |84 | ||
|113 | |113 | ||
| | |||
|- | |- | ||
!120 nm | !120 nm | ||
Line 211: | Line 215: | ||
|93 | |93 | ||
|120 | |120 | ||
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|- | |- | ||
!150 nm | !150 nm | ||
Line 222: | Line 227: | ||
|93 | |93 | ||
|129 | |129 | ||
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|- | |- | ||
| | | | ||
! colspan=" | ! colspan="10" align="center"| zep mask parameters | ||
|- | |- | ||
! start (end) | ! start (end) | ||
Line 234: | Line 240: | ||
| 110 (43) | | 110 (43) | ||
| 110 (34) | | 110 (34) | ||
| [[Specific Process Knowledge/Etch/ICP Metal Etcher/nanoetch/180nmzep|180 (64) | | [[Specific Process Knowledge/Etch/ICP Metal Etcher/nanoetch/180nmzep|180 (64)]] | ||
]] | | [[Specific Process Knowledge/Etch/ICP Metal Etcher/nanoetch/340nmzep|348 (53)]] | ||
| [[Specific Process Knowledge/Etch/ICP Metal Etcher/nanoetch/340nmzep|348 (53) | | | ||
]] | |||
|- | |- | ||
! zep etch rate (nm/min) | ! zep etch rate (nm/min) | ||
|18 | |18 | ||
Line 251: | Line 254: | ||
|39 | |39 | ||
|59 | |59 | ||
| | |||
|- | |- | ||
|} | |} |
Revision as of 10:49, 31 March 2011
Etching of nanostructures in silicon using the ICP Metal Etcher or DRIE Pegasus
Recipe | Sinano3.0 | Sinano3.1 | Sinano3.2 | Sinano3.3 | Sinano3.4 | Sinano4.0 | Sinano3.5 | Sinano3.6 | Sinano3.3 | Sinano3.7 |
---|---|---|---|---|---|---|---|---|---|---|
Cl2 (sccm) | 0 | 0 | 0 | 0 | 0 | 20 | 15 | 15 | 0 | |
BCl3 (sccm) | 5 | 3 | 5 | 5 | 5 | 0 | 5 | 5 | 5 | |
HBr (sccm) | 15 | 17 | 15 | 15 | 15 | 0 | 0 | 0 | 15 | |
Coil power (W) | 900 (Load) | 900 (Forward) | 900 (Forward) | 900 (Forward) | 900 (Forward) | 900 (Load) | 900 (Load) | 900 (Forward) | 900 (Forward) | |
Platen power (W) | 50 | 50 | 60 | 75 | 90 | 60 | 60 | 60 | 75 | |
Pressure (mtorr) | 2 | 2 | 2 | 2 | 2 | 2 | 5 | 10 | 2 | |
Process time (s) | 150 | 180 | 120 | 180 | 120 | 90 | 120 | 180 | 300 | |
Nominal line width | Etched depths (nm) | |||||||||
30 nm | 198 | 231 | 147 | 214 | 163 | 227 | 185 | 170 | 295 | |
60 nm | 256 | 308 | 181 | 305 | 229 | 253 | 191 | 185 | 411 | |
90 nm | 259 | 335 | 195 | 342 | 255 | 251 | 222 | 253 | 566 | |
120 nm | 277 | 346 | 203 | 357 | 262 | 257 | 221 | 278 | 600 | |
150 nm | 269 | 341 | 205 | 369 | 265 | 262 | 225 | 280 | 647 | |
Nominal line width | Etch rates in trenches (nm/min) | |||||||||
30 nm | 79 | 77 | 74 | 71 | 82 | 151 | 93 | 57 | 59 | |
60 nm | 102 | 103 | 91 | 102 | 115 | 169 | 96 | 62 | 82 | |
90 nm | 104 | 112 | 98 | 114 | 128 | 167 | 111 | 84 | 113 | |
120 nm | 111 | 115 | 102 | 119 | 131 | 171 | 111 | 93 | 120 | |
150 nm | 108 | 114 | 103 | 123 | 133 | 175 | 113 | 93 | 129 | |
zep mask parameters | ||||||||||
start (end) | 110 (64) | 178 (96) | 180 (110) | 180 (64) | 180 (72) | 110 (43) | 110 (34) | 180 (64) | 348 (53) | |
zep etch rate (nm/min) | 18 | 27 | 35 | 39 | 54 | 45 | 38 | 39 | 59 |