Specific Process Knowledge/Etch/DRIE-Pegasus/nanoetch: Difference between revisions
Appearance
No edit summary |
No edit summary |
||
| Line 127: | Line 127: | ||
|- | |- | ||
| | | | ||
! colspan=" | ! colspan="5" align="center"| Etch rates in zep resist (nm/min) | ||
|- | |- | ||
! One point on wafer | ! One point on wafer | ||
Revision as of 10:36, 28 March 2011
| Recipe | nano1.0 | nano1.1 | nano1.2 | nano1.3 | |
|---|---|---|---|---|---|
| Tool | Pegasus | Pegasus | Pegasus | Pegasus | |
| C4F8 (sccm) | 52 | 52 | 52 | 52 | |
| SF6 (sccm) | 38 | 38 | 38 | 38 | |
| O2 (sccm) | 0 | 0 | 0 | 0 | |
| Coil power (W) | 800 (forward) | 600 (forward) | 800 (forward) | 600 (forward) | |
| Platen power (W) | 50 | 50 | 50 | 40 | |
| Pressure (mtorr) | 4 | 4 | 4 | 4 | |
| Temperature (degs C) | 10 | 10 | -10 | -10 | |
| Process time (s) | 120 | 120 | 120 | 120 | |
| Nominal line width | Etched depths (nm) | ||||
| 30 nm | |||||
| 60 nm | |||||
| 90 nm | |||||
| 120 nm | |||||
| 150 nm | |||||
| Nominal line width | Etch rates in trenches (nm/min) | ||||
| 30 nm | |||||
| 60 nm | |||||
| 90 nm | |||||
| 120 nm | |||||
| 150 nm | |||||
| Etch rates in zep resist (nm/min) | |||||
| One point on wafer | |||||
| Images | Images | Images | Images | Images | |
The nanoetch