Specific Process Knowledge/Etch/DRIE-Pegasus/nanoetch: Difference between revisions
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! colspan="3" align="center"| Etch rates in zep resist (nm/min) | ! colspan="3" align="center"| Etch rates in zep resist (nm/min) | ||
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! | ! One point on wafer | ||
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Revision as of 09:52, 28 March 2011
Recipe | nano1.0 | ||
---|---|---|---|
Tool | Pegasus | ||
C4F8 (sccm) | 52 | ||
SF6 (sccm) | 38 | ||
O2 (sccm) | 0 | ||
Coil power (W) | 800 (forward) | ||
Platen power (W) | 50 | ||
Pressure (mtorr) | 4 | ||
Process time (s) | 120 | ||
Nominal line width | Etched depths (nm) | ||
30 nm | |||
60 nm | |||
90 nm | |||
120 nm | |||
150 nm | |||
Nominal line width | Etch rates in trenches (nm/min) | ||
30 nm | |||
60 nm | |||
90 nm | |||
120 nm | |||
150 nm | |||
Etch rates in zep resist (nm/min) | |||
One point on wafer | |||
Images | Images |
The nanoetch