Specific Process Knowledge/Etch/DRIE-Pegasus/Pegasus-4/SiO2 Etch/Cr mask: Difference between revisions
Appearance
| Line 221: | Line 221: | ||
File:C10381_30dg_17.jpg | File:C10381_30dg_17.jpg | ||
File:C10381_30dg_21.jpg | File:C10381_30dg_21.jpg | ||
</gallery> | |||
<gallery caption="SiO2 etch with Cr mask on wafer piece on Si carrier 14 min etch, EM:0/0 H2:0sccm, C4F8:13sccm He:225sccm O2:0sccm, Pressure:3.9mTorr; platen power 200W, coil power:2500W" perrow="7" widths="200px" heights="150px"> | |||
File:C10393_04.jpg | |||
File:C10393_06.jpg | |||
File:C10393_09.jpg | |||
File:C10393_11.jpg | |||
File:C10393_12.jpg | |||
File:C10393_14.jpg | |||
File:C10393_16.jpg | |||
</gallery> | </gallery> | ||