Jump to content

Specific Process Knowledge/Characterization/XRD/XRD SmartLab/Instrumental broading in GiXRD: Difference between revisions

← Older editNewer edit →
VisualWikitext
Eves (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers
4,377 edits
No edit summary
Reet (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, NLAB-Nlab347-labadviser-users-35231
1,771 edits
No edit summary
Line 7: Line 7:




This page describes values of Instrumental broadening in [[Specific_Process_Knowledge/Characterization/XRD/Process_Info#2θ_scan._Graizing_Incident_X-ray_Diffraction_(GiXRD)|GiXRD measurements]], and can be used as a reference for peak broadening in 2θ - scans. Most four common slit configuration cases are chosen.
This page describes values of Instrumental broadening in [[Specific_Process_Knowledge/Characterization/XRD/Process_Info#2θ_scan._Graizing_Incident_X-ray_Diffraction_(GiXRD)|GiXRD measurements]], and can be used as a reference for peak broadening in 2θ - scans. The four most common slit configuration cases are chosen.
The instrumental broadening has been measured by using standard Si powder sample.  
The instrumental broadening has been measured by using standard Si powder sample.  


Retrieved from "https://labadviser.nanolab.dtu.dk//index.php?title=Specific_Process_Knowledge/Characterization/XRD/XRD_SmartLab/Instrumental_broading_in_GiXRD"