Jump to content

Specific Process Knowledge/Etch/DRIE-Pegasus/Pegasus-4/SiO2 Etch/Cr mask: Difference between revisions

Bghe (talk | contribs)
Bghe (talk | contribs)
Line 215: Line 215:
<gallery caption="SiO2 etch with Cr mask on full wafer 6 min etch" perrow="6" widths="200px" heights="150px">
<gallery caption="SiO2 etch with Cr mask on full wafer 6 min etch" perrow="6" widths="200px" heights="150px">


File:C09721_center_10.jpg
 
File:C09721_center_18.jpg
File:C09721_center_21.jpg
File:C09721_center_21.jpg
File:C09721_center_07.jpg
 
File:C09721_center_05.jpg
File:C09721_center_22.jpg
</gallery>
</gallery>


Line 325: Line 322:


<gallery caption="SiO2 etch with Cr mask on wafer piece on Si carrier 10 min etch, H2:0sccm, C4F8:13sccm He:205sccm O2:20sccm, Pressure:3.6mTorr; platen power 150W, coil power:1800W" perrow="6" widths="200px" heights="150px">
<gallery caption="SiO2 etch with Cr mask on wafer piece on Si carrier 10 min etch, H2:0sccm, C4F8:13sccm He:205sccm O2:20sccm, Pressure:3.6mTorr; platen power 150W, coil power:1800W" perrow="6" widths="200px" heights="150px">
File:C10161_01.jpg
 
File:C10161_03.jpg
File:C10161_03.jpg
File:C10161_05.jpg
File:C10161_05.jpg
File:C10161_07.jpg
File:C10161_07.jpg
File:C10161_09.jpg
 
File:C10161_11.jpg
File:C010161top_01.jpg
File:C010161tilt_04.jpg
</gallery>
</gallery>