Specific Process Knowledge/Characterization/Optical characterization: Difference between revisions
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Ellipsometry is an indirect measurement so a model has to be fit to the data in order to obtain the film thickness and optical constants. To learn more about ellipsometry you can take a look at the [http://www.jawoollam.com/tutorial_1.html tutorial] provided by the J. A. Woollam Co. | Ellipsometry is an indirect measurement so a model has to be fit to the data in order to obtain the film thickness and optical constants. To learn more about ellipsometry you can take a look at the [http://www.jawoollam.com/tutorial_1.html tutorial] provided by the J. A. Woollam Co. | ||
Access to use the CompleteEASE software can be found using Remote Desktop connection to: DTU-8CC0321MFL (you can only log on when you have the user competences in LabManager) | Access to use the CompleteEASE software can be found using Remote Desktop connection to: DTU-8CC0321MFL (you can only log on when you have the user competences in LabManager) or log on to https://remote.dtu.dk. There should be a connection via Citrix to DTU-8CC0321MFL. You will be prompted for user/password. | ||