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Specific Process Knowledge/Characterization/XRD: Difference between revisions

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DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, NLAB-Nlab347-labadviser-users-35231
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Reet (talk | contribs)
DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, NLAB-Nlab347-labadviser-users-35231
1,736 edits
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0.4 mm x 12 mm (Line)
0.4 mm x 12 mm (Line)
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!style="background:silver; color:black" align="center" valign="center" rowspan="5"|Goniometer
!style="background:silver; color:black" align="center" valign="center" rowspan="4"|Goniometer
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Scanning mode
Scanning mode
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Fixed with rotation
Fixed with rotation
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Sample size
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Diameter: 150 mm
Thickness: 0~21 mm
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Powders
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!style="background:silver; color:black" align="center" valign="center" rowspan="2"|Optics
!style="background:silver; color:black" align="center" valign="center" rowspan="2"|Optics
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up to 150 mm wafers
up to 150 mm wafers
Thickness max 21 mm
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Only for powders
Only for powders
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