Specific Process Knowledge/Characterization/XRD: Difference between revisions
| Line 140: | Line 140: | ||
*In-Plane Parallel Slit Collimator (PSC) | *In-Plane Parallel Slit Collimator (PSC) | ||
*Soller slit | *Soller slit | ||
* | *Automatic variable divergence slit | ||
*Length limiting slits | |||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
*0.04° soller slit | *0.04° soller slit | ||
*Ni and Cu filter | *Ni and Cu filter | ||
*Divergence slits | *Divergence slits | ||
*Beam | *Beam masks | ||
|- | |- | ||
|style="background:LightGrey; color:black"|Receiver side | |style="background:LightGrey; color:black"|Receiver side | ||
| Line 172: | Line 173: | ||
| style="background:LightGrey; color:black"|Allowed materials | | style="background:LightGrey; color:black"|Allowed materials | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
All materials | All materials approved in the cleanroom. No powders or dusty materials. | ||
|style="background:WhiteSmoke; color:black"| | |style="background:WhiteSmoke; color:black"| | ||
All materials have to be approved | All materials have to be approved | ||