Specific Process Knowledge/Thin film deposition/Deposition of Silicon: Difference between revisions
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! PECVD ([[Specific Process Knowledge/Thin film deposition/PECVD|PECVD]]) | ! PECVD ([[Specific Process Knowledge/Thin film deposition/PECVD|PECVD]]) | ||
! Sputter ([[Specific Process Knowledge/Thin film deposition/Wordentec|Wordentec]]) | ! Sputter ([[Specific Process Knowledge/Thin film deposition/Wordentec|Wordentec]]) | ||
! Sputter ([[Specific Process Knowledge/Thin film deposition/Lesker|Lesker]]) | ! Sputter ([[Specific Process Knowledge/Thin film deposition/Lesker|Lesker]]) | ||
! Sputter ([[Specific Process Knowledge/Thin film deposition/Cluster-based multi-chamber high vacuum sputtering deposition system|Sputter-system Metal-Oxide (PC1) and Sputter-system Metal-Nitride (PC3)]]) | ! Sputter ([[Specific Process Knowledge/Thin film deposition/Cluster-based multi-chamber high vacuum sputtering deposition system|Sputter-system Metal-Oxide (PC1) and Sputter-system Metal-Nitride (PC3)]]) | ||
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! General description | ! General description | ||
|LPCVD (low pressure chemical vapour deposition) of a-Si and poly-Si | | LPCVD (low pressure chemical vapour deposition) of a-Si and poly-Si | ||
|Plasma Enhanced Chemical Vapor Deposition of Si | | Plasma Enhanced Chemical Vapor Deposition of Si | ||
| Sputter deposition of Si. | | Sputter deposition of Si. | ||
| Sputter deposition of Si. | | Sputter deposition of Si. | ||
| Sputter deposition of Si. | | Sputter deposition of Si. | ||
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|Yes, B (boron) and P (phosphorus) | |Yes, B (boron) and P (phosphorus) | ||
|Yes, B and P | |Yes, B and P | ||
|None | |None | ||
|None | |None | ||
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|RF Ar clean available | |RF Ar clean available | ||
|RF Ar clean available | |RF Ar clean available | ||
|RF Ar clean available | |RF Ar clean available | ||
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|few nm to ~ 600 nm | |few nm to ~ 600 nm | ||
|few nm to ~ 300 nm | |few nm to ~ 300 nm | ||
|few nm to >200 nm | |few nm to >200 nm | ||
|few nm to ? | |few nm to ? | ||
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On the order of 1 Å/s dependent on process parameters. See more [[Specific Process Knowledge/Thin film deposition/Si sputter in Wordentec|here.]] | On the order of 1 Å/s dependent on process parameters. See more [[Specific Process Knowledge/Thin film deposition/Si sputter in Wordentec|here.]] | ||
| Depends on process parameters, roughly 0.2-2 Å/s. See Process Log. | | Depends on process parameters, roughly 0.2-2 Å/s. See Process Log. | ||
|Depends on process parameters, at least 0.3 Å/s, see conditions [[Specific_Process_Knowledge/Thin_film_deposition/Cluster-based_multi-chamber_high_vacuum_sputtering_deposition_system#Standard_recipe_performance|here]] | |Depends on process parameters, at least 0.3 Å/s, see conditions [[Specific_Process_Knowledge/Thin_film_deposition/Cluster-based_multi-chamber_high_vacuum_sputtering_deposition_system#Standard_recipe_performance|here]] | ||
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|560 °C (amorphous) and 620 °C (poly) | |560 °C (amorphous) and 620 °C (poly) | ||
|300 °C | |300 °C | ||
|Wafers can be heated to 400 °C | |Wafers can be heated to 400 °C | ||
|Wafers can be heated to 600 °C | |Wafers can be heated to 600 °C | ||
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|Medium | |Medium | ||
|Medium | |Medium | ||
|Medium | |Medium | ||
|Medium - may be possible to improve using HIPIMS | |Medium - may be possible to improve using HIPIMS | ||
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|Not tested, but do not deposit on top of silicon | |Not tested, but do not deposit on top of silicon | ||
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*6x 4" wafers or | *6x 4" wafers or | ||
*6x 6" wafers | *6x 6" wafers | ||
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* Up to 1x6" wafers | * Up to 1x6" wafers | ||
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*See the cross contamination sheets | *See the cross contamination sheets | ||
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* | *Almost any that does not degas. | ||
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* Almost any that does not degas, see cross-contamination sheet | * Almost any that does not degas, see cross-contamination sheet | ||
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*See the cross contamination sheets | *See the cross contamination sheets | ||
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* | * Almost any that does not degas. | ||
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*Almost any that does not degas, see the cross-contamination sheet | *Almost any that does not degas, see the cross-contamination sheet | ||
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|Only in PECVD3 | |Only in PECVD3 | ||
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Historical note: It was previosly possible to deposit Si with our [[Specific Process Knowledge/Etch/IBE⁄IBSD Ionfab 300| IonFab 300]]. You can read about the deposition conditions and results from that [[Specific Process Knowledge/Etch/IBE⁄IBSD Ionfab 300/IBSD of Si|here]]. |
Revision as of 13:56, 22 January 2024
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Unless otherwise stated, this page is written by DTU Nanolab internal
PolySilicon can be deposited in several Nanolab tools. It can be sputtered, e-beam evaporated or be deposited in the PolySilicon furnaces. In the chart below you can compare the different deposition methods:
Deposition of PolySilicon using LPCVD
DTU Nanolab has two furnaces for deposition of LPCVD (Low Chemical Vapour Deposition) polysilicon: A 6" furnace (installed in 2011) for deposition of standard polySi, amorphous polySi and boron doped polySi on 100 mm or 150 mm wafers and a 4" furnace (installed in 1995) for deposition of standard polySi, amorphous polySi, boron- and phosphorous doped polySi on 100 mm wafers. In LabManager the two furnaces are named "Furnace: LPCVD Poly-Si (4") (B4)" and "Furnace: LPCVD Poly-Si (6") (E2)", respectively.
- Deposition of polysilicon using the 4" polysilicon furnace
- Deposition of polysilicon using the 6" polysilicon furnace
Deposition of Silicon using sputter deposition technique
At Nanolab you can also deposit silicon the using Wordentec, the Lesker Sputter systems or the IBE Ionfab300 sputter systems. One of the advantages here is that you can deposit on any material you like.
- Si deposition in IBE⁄IBSD Ionfab300
- Si sputter deposition in the Wordentec
- Si sputter deposition in the Sputter-System (Lesker) - includes information on surface roughness and stress
- Si sputter deposition in the Sputter-System Metal-Oxide(PC1)
- Si sputter deposition in the Sputter-System Metal-Oxide(PC3)
Deposition of Silicon using PECVD
At Nanolab you can also deposit silicon the using PECVD. The deposition temperature is 300 °C.
Comparison of the methods for deposition of Silicon
4" and 6" Furnace PolySi (Furnace LPCVD PolySi) | PECVD (PECVD) | Sputter (Wordentec) | Sputter (Lesker) | Sputter (Sputter-system Metal-Oxide (PC1) and Sputter-system Metal-Nitride (PC3)) | |
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General description | LPCVD (low pressure chemical vapour deposition) of a-Si and poly-Si | Plasma Enhanced Chemical Vapor Deposition of Si | Sputter deposition of Si. | Sputter deposition of Si. | Sputter deposition of Si. |
Doping facility | Yes, B (boron) and P (phosphorus) | Yes, B and P | None | None | None |
Pre-clean | New wafers can go directly into the furnace. Processed wafers have to be RCA cleaned | RF Ar clean available | RF Ar clean available | RF Ar clean available | |
Layer thickness | ~5 nm to 2 µm, if thicker layers are needed please ask the furnace team. | few nm to ~ 600 nm | few nm to ~ 300 nm | few nm to >200 nm | few nm to ? |
Deposition rate |
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~6 Å/s can probably be higher |
On the order of 1 Å/s dependent on process parameters. See more here. |
Depends on process parameters, roughly 0.2-2 Å/s. See Process Log. | Depends on process parameters, at least 0.3 Å/s, see conditions here |
Process temperature | 560 °C (amorphous) and 620 °C (poly) | 300 °C | Wafers can be heated to 400 °C | Wafers can be heated to 600 °C | |
Step coverage | Good | Medium | Medium | Medium | Medium - may be possible to improve using HIPIMS |
Adhesion | Good for fused silica, silicon oxide, silicon nitride, silicon | Not tested, but do not deposit on top of silicon | |||
Batch size |
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Allowed substrates |
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Allowed material | *Only those above (under allowed substrates). |
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Comment | Only in PECVD3 |
Historical note: It was previosly possible to deposit Si with our IonFab 300. You can read about the deposition conditions and results from that here.