Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy/KPFM: Difference between revisions
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===Here I shortly explain how to calibrate to get work function values=== | ===Here I shortly explain how to calibrate to get work function values=== | ||
To get a quantitative value for the work function of a sample material you need to calibrate the AFM tip you are using. This is done by measuring a material with a known work function. We do not have a certified sample for this but we are using a sample that came with the system. It has some lines of Au-Si-Al right next to each other. The below image is from the Bruker application note: | To get a quantitative value for the work function of a sample material you need to calibrate the AFM tip you are using. This is done by measuring a material with a known work function. We do not have a certified sample for this but we are using a sample that came with the system. It has some lines of Au-Si-Al right next to each other. The below image is from the Bruker application note: [[File:PeakForce-Kelvin-Probe-Force-Microscopy-App-Note-BRUKER.pdf]] - used with permission | ||
[[File:PeakForce-Kelvin-Probe-Force-Microscopy-App-Note-BRUKER.pdf]] - used with permission | |||
[[File:KPFM workfunction Au Si Al.jpg|400px]] | [[File:KPFM workfunction Au Si Al.jpg|400px]] | ||