Specific Process Knowledge/Thermal Process/RTP Annealsys: Difference between revisions
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*Max. 2000 SCCM | *Max. 2000 SCCM | ||
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|style="background:Silver; color:black"|NH<sub>3 | |style="background:Silver; color:black"|NH<sub>3 | ||
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*Max. 2000 SCCM | *Max. 2000 SCCM | ||
|style="background:WhiteSmoke; color:black;" align="left"|'''Not | |style="background:WhiteSmoke; color:black;" align="left"|'''Not tested'''. | ||
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|style="background:Silver; color:black"|5% H<sub>2</sub>/Ar | |style="background:Silver; color:black"|5% H<sub>2</sub>/Ar | ||
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*Silicon Nitride | *Silicon Nitride | ||
*Aluminum Oxide | *Aluminum Oxide | ||
|style="background:WhiteSmoke; color:black;" align="left"| ''' | |style="background:WhiteSmoke; color:black;" align="left"| During previous testing, '''silicon nitride''' and '''aluminum oxide''' were only used as '''coating/masking materials''' and have been proven capable of sustaining this type of high temperature processing. | ||
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