Specific Process Knowledge/Lithography/Aligners/Aligner: Maskless 03 processing: Difference between revisions
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'''Result of using "Expose with Global Angle":''' | '''Result of using "Expose with Global Angle":''' | ||
*Rotation: 0. | *Rotation: 0.05 ±0.2° | ||
*Centering: | *Centering: | ||
** '''X''' - | ** '''X''' -125 ±25 µm | ||
** '''Y''' | ** '''Y''' 104 ±36 µm | ||
Jehem Feb 2020, average of 3 | Jehem Feb 2020, average of 3 100 mm wafers. | ||
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|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
|Jehem Feb 2020 | |Jehem Feb 2020 | ||
| 3.6 | | 3.6 mrad | ||
| ±1.4 | | ±1.4 mrad | ||
±0.08° | ±0.08° | ||
| Line 139: | Line 139: | ||
As expected from | As expected from MLA1 and MLA2, the accuracy of flat alignment on MLA3 is ±0.1°, and the substrate centering is within a couple of hundred µm. | ||
==Labeling== | ==Labeling== | ||