Specific Process Knowledge/Etch/III-V RIE: Difference between revisions
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Latest revision as of 16:10, 22 March 2023
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III-V RIE Plassys
Name: MG300 RIE
Vendor: Plassys
General information
Dry etching of III-V compound semiconductors is performed with a conventional Reactive Ion Etch (RIE) located in cleanroom A-1. The III-V RIE is a Plassys model MG300. Find the company website her: Plassys.
The system is equipped with a laser interferometer to monitor etch-rate and -depth.
The user manuals, user APVs, technical information and contact information can be found in LabManager:
The diameter of the quartz plate is 20 cm with a recess for 4" wafers, ie up to one 4" wafer, one 3" wafer or one 2" wafer or several smaller samples can be processed simultaneously. To strike a plasma, the applied power should be 50 W or more; if a process needs a lower power during etch it is necessary to initially strike the plasma with eg 50 W (higher powers are needed for lower gas pressures) for 5-10 sec where after the power can be lowered to the desired value.
The chamber should be cleaned after all usage of the machine; read more under Chamber Cleaning.
Process information
- CHF3/O2 RIE - SiO2 and Si3Ni4 etch
- CH4/H2 RIE - InP and InGaAs(P) etch
- BCB polymer RIE - BCB polymer and resist etch
- Chamber Cleaning - Chamber cleaning
Purpose | Dry etch of |
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Performance (see specific recipes) | Etch rates |
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Anisotropy |
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Process parameters | Plasma pressure |
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Maximum Gas flows |
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Substrates | diameter of quartz plate |
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Material allowed |
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