Specific Process Knowledge/Etch/III-V RIE: Difference between revisions

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*20 cm
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* III-V compound semiconductors
* III-V compound semiconductors
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* Silicon based materials
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* Photoresist/e-beam resist
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* BCB
*Photoresist/e-beam resist
* For other materials, please ask
*Titanium
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Latest revision as of 16:10, 22 March 2023

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Unless otherwise stated, this page is written by DTU Nanolab internal

III-V RIE Plassys

Name: MG300 RIE
Vendor: Plassys

General information

III-V RIE is located in room A-1

Dry etching of III-V compound semiconductors is performed with a conventional Reactive Ion Etch (RIE) located in cleanroom A-1. The III-V RIE is a Plassys model MG300. Find the company website her: Plassys.

The system is equipped with a laser interferometer to monitor etch-rate and -depth.

The user manuals, user APVs, technical information and contact information can be found in LabManager:

III-V RIE (Plassys)


The diameter of the quartz plate is 20 cm with a recess for 4" wafers, ie up to one 4" wafer, one 3" wafer or one 2" wafer or several smaller samples can be processed simultaneously. To strike a plasma, the applied power should be 50 W or more; if a process needs a lower power during etch it is necessary to initially strike the plasma with eg 50 W (higher powers are needed for lower gas pressures) for 5-10 sec where after the power can be lowered to the desired value.

The chamber should be cleaned after all usage of the machine; read more under Chamber Cleaning.

Process information

Overview of the performance of the RIE´s and some process-related parameters

Purpose Dry etch of
  • SiO2
  • Si3N4
  • BCB
  • Resist
  • InP
  • InGaAs
Performance (see specific recipes) Etch rates
  • SiO2: ~1-30 nm/min
  • Si3N4: ~17-38 nm/min
  • BCB: ~70-880 nm/min (needs testing)
  • Resist: ~30-98 nm/min (AZ5206 and ZEP520A), ~70-815 nm/min (AZ5214)
  • InP: ~29 nm/min
  • GaAs: ~9 nm/min
Anisotropy
  • Can vary from isotropic to anisotropic with vertical sidewalls and on to a physical etch were the sidewalls are angled but without etching under the mask.
Process parameters Plasma pressure
  • down to 10 mTorr
Maximum Gas flows
  • O2: 50 sccm
  • CHF3: 17.5 sccm
  • CH4: 10 sccm
  • H2: 50 sccm
  • Ar: 20 sccm
Substrates diameter of quartz plate
  • 20 cm
Material allowed
  • III-V compound semiconductors
  • Silicon based materials
  • Photoresist/e-beam resist
  • BCB
  • For other materials, please ask