Specific Process Knowledge/Etch/DRIE-Pegasus/Pegasus-4/Slow etch: Difference between revisions

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==Etch Profile SEM images==
==Etch Profile SEM images==
<gallery caption="Profile of etch for 'Slow Etch2' 12 min" widths="300px done by bghe, DTU Nanolab" heights="500px" perrow="3">
<gallery caption="Profile of etch for 'Slow Etch2' 12 min" widths="300px done by bghe, DTU Nanolab" heights="300px" widths="400px" perrow="3">
File:C08507_01.jpg
File:C08507_01.jpg
File:C08507_02.jpg
File:C08507_02.jpg

Revision as of 10:02, 8 March 2023

The slow etch

This work is done by Berit Herstrøm @DTU Nanolab, is nothing else is stated
The slow etch is designed to etch slow at low powers to etch thin films and to avoid overheating of samples mounted on a carrier with Capton/polyimide tape

Parameter Recipe name: Slow Etch Recipe name: Slow Etch2
Coil Power [W] 350 200
Platen Power [W] 25 50
Platen temperature [oC] 20 20
H2 flow [sccm] 15 15
CF4 flow [sccm] 30 30
Pressure [mTorr] 3 10
Typical results Slow Etch Slow Etch2
Etch of SRN ~43nm/min [measured 39-50 nm/min over a 6" wafer] 23-25 nm/min [4" on carrier]]
Etch rate of Si3N4 ~49 nm/min [4" on carrier] 24-26 nm/min [4" on carrier]
Etch rate of SiO2 ~42nm/min [41-43 nm/min over a 6" wafer] 13.7-14.7 nm/min [4" on carrier]
Etch rate in Si ñm/min 11-13 nm/min (10% load, 4" wafer on 6" carrier)
Etch rate of Mir resist ~nm/min ~17 nm/min
Tested etch time without burning the resist 3 min 30 min
Profile [o]

Etch Profile SEM images

Etch Uniformity maps