Specific Process Knowledge/Lithography/EBeamLithography/FirstEBL: Difference between revisions
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**Execute absorbed electron mark detection | **Execute absorbed electron mark detection | ||
**Execute backscatter electron mark detection | **Execute backscatter electron mark detection | ||
*Execute self calibration routine | *Execute self calibration routine '''daily''' | ||
*Verify drift is low | *Verify drift is low | ||
*Map height profile of sample | *Map height profile of sample | ||