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Specific Process Knowledge/Etch/III-V ICP/GaAs-AlGaAs: Difference between revisions

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Line 24: Line 24:
|-
|-
|Platen chiller  temperature
|Platen chiller  temperature
|20 <sup>o</sup>C
|20<sup>o</sup>C
|-
|-
|}
|}
Line 36: Line 36:
|-
|-
|Sidewall angle
|Sidewall angle
|~ 85-90 <sup>o</sup>
|~ 85-90<sup>o</sup>
|-
|-
|Selectivity (GaAs:Si<sub>3</sub>N<sub>4</sub>, GaAs:AlInP)  
|Selectivity (GaAs:Si<sub>3</sub>N<sub>4</sub>, GaAs:AlInP)  
Line 64: Line 64:
|-
|-
|Platen chiller  temperature
|Platen chiller  temperature
|20 <sup>o</sup>C
|20<sup>o</sup>C
|-
|-
|}
|}
Line 76: Line 76:
|-
|-
|Sidewall angle
|Sidewall angle
|~ 90 <sup>o</sup>
|~ 90<sup>o</sup>
|-
|-
|Selectivity (GaAs:SiO<sub>2</sub>)  
|Selectivity (GaAs:SiO<sub>2</sub>)  
Line 110: Line 110:
|-
|-
|Platen chiller  temperature
|Platen chiller  temperature
|20 <sup>o</sup>C
|20<sup>o</sup>C
|-
|-
|}
|}
Line 122: Line 122:
|-  
|-  
|Sidewall angle
|Sidewall angle
|85-90 <sup>o</sup>
|85-90<sup>o</sup>
|-
|-
|Selectivity (GaAs:Si<sub>3</sub>N<sub>4</sub>, GaAs:AlInP)  
|Selectivity (GaAs:Si<sub>3</sub>N<sub>4</sub>, GaAs:AlInP)