Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy/samplemount: Difference between revisions
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: You can 'access' the sample in a way that enables you to take the images you need: If, for instance, short working distance is needed to ensure optimum conditions for the Inlens detector, the sample must be mounted in a way that makes it possible. | : You can 'access' the sample in a way that enables you to take the images you need: If, for instance, short working distance is needed to ensure optimum conditions for the Inlens detector, the sample must be mounted in a way that makes it possible. | ||
; Problems with charging are minimized | ; Problems with charging are minimized | ||
: In most cases where users complain that the sample seems to be drifting | : In most cases where users complain that the sample seems to be drifting, the reason is bad grounding due to sloppy mounting. ''Note: You can check the grounding of the stage prior to pumping the chamber down: Use a metal object to touch both the top of the stage and a lower part of the stage and listen for a high-pitched touch alarm. If there is no alarm, contact staff. (Edit by reet)'' | ||
; Limit the waste of time | ; Limit the waste of time | ||
: Finding the right feature on a sample is more tricky than one would think due to the limited field of view. Making sketches of feature positions on the sample or drawing on the sample itself is often a great help. | : Finding the right feature on a sample is more tricky than one would think due to the limited field of view. Making sketches of feature positions on the sample or drawing on the sample itself is often a great help. | ||