Specific Process Knowledge/Characterization/XRD/Process Info: Difference between revisions
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[[File:RC.png|400px]] | [[File:RC.png|400px]] | ||
==2θ scan. Graizing Incident X-ray Diffraction(GiXRD)== | ==2θ scan. Graizing Incident X-ray Diffraction (GiXRD)== | ||
<gallery caption="XPS recordings. 10 nm SiC deposited on Si wafer" widths="300px" heights="250px" perrow="1"> | <gallery caption="XPS recordings. 10 nm SiC deposited on Si wafer" widths="300px" heights="250px" perrow="1"> | ||
image:eves_2theta_scan_concept_20230131.png|<b>C 1s</b> signal. | image:eves_2theta_scan_concept_20230131.png|<b>C 1s</b> signal. | ||