Specific Process Knowledge/Characterization/XRD/Process Info: Difference between revisions
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== Process information == | == Process information == | ||
The following measurements types are just some of the options you have on the [http://labadviser.nanolab.dtu.dk/index.php?title=Specific_Process_Knowledge/Characterization/XRD/XRD_SmartLab Rigaku SmartLab] | The following measurements types are just some of the options you have on the [http://labadviser.nanolab.dtu.dk/index.php?title=Specific_Process_Knowledge/Characterization/XRD/XRD_SmartLab Rigaku SmartLab] | ||
=Types of scans in the reciprocal space= | |||
<gallery caption="XPS recordings. 10 nm SiC deposited on Si wafer" widths="700px" heights="500px" perrow="1"> | |||
image:eves_types_of_scans_20230131.png|<b>C 1s</b> signal. | |||
</gallery> | |||
===XRR=== | ===XRR=== | ||