Specific Process Knowledge/Thermal Process/RTP Annealsys: Difference between revisions
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*up to 2000 SCCM | *up to 2000 SCCM | ||
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|style="background:LightGrey; color:black"|O<sub>2 | |style="background:LightGrey; color:black"|O<sub>2 | ||
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*up to 2000 SCCM | *up to 2000 SCCM | ||
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|style="background:LightGrey; color:black"|NH<sub>3 | |style="background:LightGrey; color:black"|NH<sub>3 | ||
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*up to 2000 SCCM | *up to 2000 SCCM | ||
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|style="background:LightGrey; color:black"|5% H<sub>2</sub>/Ar | |style="background:LightGrey; color:black"|5% H<sub>2</sub>/Ar | ||
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*up to 2000 SCCM | *up to 2000 SCCM | ||
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!style="background:silver; color:black" align="center" valign="center" rowspan="2"|Pressure | !style="background:silver; color:black" align="center" valign="center" rowspan="2"|Pressure | ||
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*0<sup>o</sup> - 100<sup>o</sup> | *0<sup>o</sup> - 100<sup>o</sup> | ||
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|style="background:LightGrey; color:black"|Controller | |style="background:LightGrey; color:black"|Controller | ||
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*up to 12 mbar | *up to 12 mbar | ||
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!style="background:silver; color:black" align="center" valign="center" rowspan="3"|Substrates | !style="background:silver; color:black" align="center" valign="center" rowspan="3"|Substrates | ||
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*Single-wafer process | *Single-wafer process | ||
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|style="background:LightGrey; color:black"|Substrate size | |style="background:LightGrey; color:black"|Substrate size | ||
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*Chips on carrier | *Chips on carrier | ||
*100 mm or 150 mm wafers | *100 mm or 150 mm wafers | ||
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| style="background:LightGrey; color:black"|Allowed materials | | style="background:LightGrey; color:black"|Allowed materials | ||
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*Silicon Nitride | *Silicon Nitride | ||
*Aluminum Oxide | *Aluminum Oxide | ||
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