Specific Process Knowledge/Characterization/XPS/NexsaOverview

Overview of the processing options on the XPS Nexsa

The acquisition of an instrument like the Nexsa has to be done through a EU tender process. As a somewhat unexpected result of this process, we were offered the Nexsa at a very favorable price. We were therefore able to squeeze all but one of the available options into the budget. That is, of course, very nice indeed, but it also means that we will have to investigate the applications of the various techniques as there is no applications waiting for a specific technique to become available.

We have therefore compiled the table below that contains articles and application notes in which several of the available techniques are used

The columns contain the following information (excluded are the columns where the content is evident):

• Title: Click on the title to access a pdf version of the article/application note.
• Web of Science: Click here to access the article in the Web of Science database (log on to WoS via DTU Inside in advance, click this link ). This will enable you to browse the cited references and citations of the article.
• Abstract: Hover the mouse over the text to show the abstract of the article.

Template:Nexsa-addpubrow | [1] | | |[ link] | | | | | | | |Abstract |- | Multitechnique Surface Characterization of Organic LED Material |Application note |P Mack |link |x |x | |x | | |Organic LED's |Abstract |-

| Advantages of coincident XPS-Raman in the analysis of mineral oxides species |Application note |Thermofisher Scientific |link |x | | | |x | |TiO₂, CaCO₃ |Abstract |-

| Spectroscopic analysis of solid oxide fuel cell material with XPS |Application note |P Mack |link |x | | | | | | |Abstract |-

| Rapid XPS image acquisition using SnapMap |Application note |R Simpson |link | | | | | |SnapMap | |Abstract |-

|- | Composition, coverage and band gap analysis of ALD-grown ultra thin films||Application note||P Mack ||||X||||X||X||||Band gap||Gate dielectrics, HfO2, SiO2|| |- | Confirming the layer structure of an organic FET device||Application note||P Mack ||||X||||||||||MAGCIS||Organic FET's,|| |- | Surface analysis of zeolites: An XPS, variable kinetic energy XPS, and low energy ion scattering study |Publication |SR Bare |link |x | |x | | | |Zeolites, Metal oxides |Abstract |-

| Surface composition analysis by low-energy ion scattering |Publication, background |H H Brongersma |link | | |x | | | | |Abstract |-

| Diffusion of In_0.53Ga_0.47As elements through hafnium oxide during post deposition annealing |Publication |W Cabrera |link |x | |x | | |TEM |HfO2, InGaAs, ALD |Abstract |-

| Low energy ion scattering (LEIS). A practical introduction to its theory, instrumentation, and applications |Publication, review |C V Cushman |link | | |x | | | | |Abstract |-

| HfO₂ on MoS₂ by Atomic Layer Deposition: Adsorption Mechanisms and Thickness Scalability |Publication |S McDonnell |link | | |x | | |AFM, ALD |HfO2, MoS2 |Abstract |-

| Highly Sensitive Detection of Surface and Intercalated Impurities in Graphene by LEIS |Publication |S Prusa |link | | |x | | | |Graphene |Abstract |-

| Reflection electron energy loss spectroscopy for ultrathin gate oxide materials |Publication |H C Shin |link |x | | |x | |Valence band |HfZrO₄ |Abstract |-

| Oxygen accumulation on metal surfaces investigated by XPS, AES and LEIS, an issue for sputter depth profiling under UHV conditions |Publication |R Steinberger |link |x | |x | | |AES, ARXPS, sputter profiles |Oxygen on metal surfaces |Abstract |-

| Electrochemical Characterization and Quantified Surface Termination Obtained by Low Energy Ion Scattering and X-ray Photoelectron Spectroscopy of Orthorhombic and Rhombohedral LaMnO₃ Powders |Publication |E Symianakis |link |x | |x | | |XRD |Catalysts, LaMnO3 |Abstract |-

| The Thermal Oxidation of TiAlN High Power Pulsed Magnetron Sputtering Hard Coatings as Revealed by Combined Ion and Electron Spectroscopy |Publication |M Wiesing |[ link] |x |x |x | | |Ar sputtering |TiAlN |Abstract |-

| Electronic structure and energy band gap of poly(9,9-dioctylfluorene) investigated by photoelectron spectroscopy |Publication |L. S. Liao |link |x | | |x | | |Polymer |Abstract |-

| Electronic and optical properties of hafnium indium zinc oxide thin film by XPS and REELS |Publication |Y. R. Denny |link |x | | |x | | | |Abstract |- |- |}

Please don't hesitate to contact us if you find a relevant article to include in the table. Or if any of the articles listed is not suitable.