Specific Process Knowledge/Characterization/Profiler: Difference between revisions
| Line 239: | Line 239: | ||
==Optical Profiler (Filmetrics)== | ==Optical Profiler (Filmetrics)== | ||
''This section is written by Berit Herstrøm @DTU Nanolab' | ''This section is written by Berit Herstrøm @DTU Nanolab' | ||
[[image:Scanner without anotation.jpg|275x275px|right|thumb|Optical Profiler (Filmetrics): positioned in the basement (346-904)]] | [[image:Scanner without anotation.jpg|275x275px|right|thumb|Optical Profiler (Filmetrics): positioned in the basement (346-904), photo: DTU Nanolab internal]] | ||
The Profilm3D optical profiler from Filmetrics uses white-light-interferometry (WLI) and phase-shifting-interferometry (PSI) to produce surface profiles and depth-of-field color images. | The Profilm3D optical profiler from Filmetrics uses white-light-interferometry (WLI) and phase-shifting-interferometry (PSI) to produce surface profiles and depth-of-field color images. | ||