Specific Process Knowledge/Lithography/EBeamLithography/EBLLandingpage: Difference between revisions
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[[File:EBLWorkflow.png|1200px|frameless|center|alt=Generalized EBL workflow.|Generalized EBL workflow.]] | [[File:EBLWorkflow.png|1200px|frameless|center|alt=Generalized EBL workflow.|Generalized EBL workflow.]] | ||
Since substrate preparation and development processes are (nearly) identical for the JEOL and Raith eLine systems they are described in common below. Pattern preparation, job preparation and job execution are fairly different between the two tools and hence these steps are described on the specific tool pages. | |||
= E-beam resists = | = E-beam resists = | ||