Specific Process Knowledge/Etch/DRIE-Pegasus/Pegasus-4/Slow etch: Difference between revisions
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| | |H2 flow [sccm] | ||
| | |15 | ||
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|CF<sub>4</sub> flow [sccm] | |CF<sub>4</sub> flow [sccm] | ||
| | |40 | ||
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Revision as of 11:30, 15 December 2022
The slow etch
The slow etch is designed to etch slow at low powers to etch thin films and to avoid overheating of samples mounted on a carrier with Capton/polyimide tape
Parameter | Recipe name: Slow Etch |
---|---|
Coil Power [W] | 350 |
Platen Power [W] | 25 |
Platen temperature [oC] | 20 |
H2 flow [sccm] | 15 |
CF4 flow [sccm] | 40 |
Pressure [mTorr] | 3 |
Typical results | Test Results |
---|---|
Etch of SRN | ~43nm/min [measured 39-50 nm/min over a 6" wafer] |
Etch rate of Si3N4 | ~49nm/min [4" on carrier] |
Etch rate of SiO2 | ~42nm/min [41-43 nm/min over a 6" wafer] |
Etch rate of DUV resist] | ~nm/min
|
Profile [o] |
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Etch rate map of SiO2 etch on 6" wafer
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Etch rate map of SRN etch on 6" wafer