Specific Process Knowledge/Thin film deposition/Deposition of Palladium: Difference between revisions
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! E-beam evaporation ([[Specific Process Knowledge/Thin film deposition/Temescal|Temescal]]) | ! E-beam evaporation ([[Specific Process Knowledge/Thin film deposition/Temescal|Temescal]]) | ||
! E-beam evaporation ([[Specific_Process_Knowledge/Thin_film_deposition/Wordentec|Wordentec]]) | ! E-beam evaporation ([[Specific_Process_Knowledge/Thin_film_deposition/Wordentec|Wordentec]]) | ||
! Sputter deposition ([[Specific Process Knowledge/Thin film deposition/Lesker|Sputter-System (Lesker)]]) | |||
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|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
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| E-beam deposition of Pd | | E-beam deposition of Pd | ||
| E-beam deposition of Pd | | E-beam deposition of Pd | ||
| Sputter deposition of Pd | |||
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|-style="background:Lightgrey; color:black" | |-style="background:Lightgrey; color:black" | ||
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|Ar ion source | |Ar ion source | ||
|none | |none | ||
|RF Ar clean | |||
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|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
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|10 Å - 600 nm* | |10 Å - 600 nm* | ||
|10 Å - 600 nm* | |10 Å - 600 nm* | ||
|10 Å - 600 nm* | |||
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|-style="background:Lightgrey; color:black" | |-style="background:Lightgrey; color:black" | ||
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|0.5 Å/s to 10Å/s | |0.5 Å/s to 10Å/s | ||
|2 Å/s to 10Å/s | |2 Å/s to 10Å/s | ||
|Up to 4.3 Å/s | |||
|- | |- | ||
|-style="background:WhiteSmoke; color:black" | |-style="background:WhiteSmoke; color:black" | ||
! Batch size | ! Batch size | ||
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*Up to 6x4" wafers (deposition on one wafer at the time) | *Up to 6x4" wafers (deposition on one wafer at the time) | ||
*smaller wafers and pieces | *smaller wafers and pieces | ||
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*1x4" wafer or | |||
*1x6" wafer or | |||
*several small samples | |||
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|-style="background:Lightgrey; color:black" | |-style="background:Lightgrey; color:black" | ||
!Allowed materials | !Allowed materials | ||
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*Silicon oxide | |||
*Silicon (oxy)nitride | |||
*Photoresist | |||
*PMMA | |||
*Mylar | |||
*Metals | |||
*See also the [http://labmanager.dtu.dk/function.php?module=XcMachineaction&view=edit&MachID=429 cross-contamination sheet] | |||
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*Silicon oxide | *Silicon oxide | ||
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! Comment | ! Comment | ||
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Revision as of 10:51, 1 February 2023
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Palladium can be deposited by e-beam evaporation. In the chart below you can compare the different deposition equipment:
E-beam evaporation (Temescal) | E-beam evaporation (Wordentec) | Sputter deposition (Sputter-System (Lesker)) | |
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General description | E-beam deposition of Pd | E-beam deposition of Pd | Sputter deposition of Pd |
Pre-clean | Ar ion source | none | RF Ar clean |
Layer thickness | 10 Å - 600 nm* | 10 Å - 600 nm* | 10 Å - 600 nm* |
Deposition rate | 0.5 Å/s to 10Å/s | 2 Å/s to 10Å/s | Up to 4.3 Å/s |
Batch size |
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Allowed materials |
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Comment |
* If depositing more than 600 nm, please write to metal@nanolab.dtu.dk well in advance to ensure that enough material is present.