Specific Process Knowledge/Characterization/XRD/SLSII analysis: Difference between revisions
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===RS viewer=== | ===RS viewer=== | ||
RS viewer is an utility for simulating and viewing the reciprocal space for one or more materials at a time. In the old software this was called 'Diffraction Space Simulation'. The utility is handy for finding 2θ angles, and how to position the goniometer for measuring in | RS viewer is an utility for simulating and viewing the reciprocal space for one or more materials at a time. In the old software this was called 'Diffraction Space Simulation'. The utility is handy for finding 2θ angles, and how to position the goniometer for measuring in a skewed geometry. The RS viewer can be opened from either the XRD Measurement tab or the HRXRD tab by clicking the button on the ribbon. | ||
In the RS viewer it is possible to make a sample model consisting of substrates and a number | In the RS viewer it is possible to make a sample model consisting of substrates and a number of layers on top. Unfortunately it is not possible to change the concentrations of different atoms in a composition as it is in the HRXRD sample building. But for each layer it is possible to change sample axis, e. g. changing the substrate normal from (0 0 1) to (1 1 1). Using the RS viewer for setting up Reciprocal space mapping (RSM) is done in this way: | ||
*Sample: | *Sample: | ||
**Change the substrate to | **Change the substrate to the desired material. | ||
**Check that 'Normal Sz' under 'Sample Axes' is correct. | **Check that 'Normal Sz' under 'Sample Axes' is correct. | ||
**Add layers by right clicking on an existing layer and click Insert New Layer. | **Add layers by right clicking on an existing layer and click Insert New Layer. | ||
**Configure added layer with material and expected orientation. | **Configure the added layer(s) with the material type and expected orientation. | ||
*Measurement: | *Measurement: | ||
** | **Choose the goniometer geometry desired for the measurement. Often In-plane is wanted to avoid tilting the sample. | ||
** | **Choose if the reflection is symmetric or asymmetric for Out-of-plane (ω step). | ||
** | **Choose X-ray target as Cu-Kα<sub>1</sub>. | ||
*Reflection information: | *Reflection information: | ||
**Select the layer for measurement. | **Select the layer for measurement. | ||
**Select the reflection for measurement, either by clicking on the simulation map or by typing in the number. Only allowed reflections in the chosen geometry are shown. | **Select the reflection for measurement, either by clicking on the simulation map or by typing in the number. Only allowed reflections in the chosen geometry are shown. | ||
**In the reflection box, | **In the reflection box, information about the reflection, like 2θ |F|, |F|<sup>2</sup> and the incident and reflected angles are listed. | ||
**The five relevant axes for RSM configuration are listed below. | **The five relevant axes for RSM configuration are listed below. | ||
**Numbers at the left side of the slider are offsets needed for the measurement. | **Numbers at the left side of the slider are offsets needed for the measurement. | ||
**To the right it is possible to | **To the right it is possible to choose if the measurement should be done relative to the offset or in absolute values. | ||
**For the relevant axes, the measurement range can be set. | **For the relevant axes, the measurement range can be set. | ||
**At the bottom, show area will highlight the measurement area defined, and offsets can be | **At the bottom, "show area" will highlight the measurement area defined, and offsets can be sent to the goniometer, while areas can be sent to measurement configuration. | ||
For more information please click on ? in the RS viewer window or see [http://labmanager.dtu.dk/view_binary.php?fileId=4249 LabManager]. | For more information please click on ? in the RS viewer window or see [http://labmanager.dtu.dk/view_binary.php?fileId=4249 LabManager]. | ||