Specific Process Knowledge/Characterization/Optical characterization: Difference between revisions

Revision as of 15:01, 6 September 2022 view source Bghe (talk \| contribs) DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, Bureaucrats, Administrators 7,304 edits →Ellipsometer VASE and Ellipsometer M-2000V ← Older edit		Revision as of 15:03, 6 September 2022 view source Bghe (talk \| contribs) DCH-Employees-701, NLAB-Employees-701, NLAB-LabmanagerAllUsers, Bureaucrats, Administrators 7,304 edits →Ellipsometer VASE and Ellipsometer M-2000V Newer edit →
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	Ellipsometry is an indirect measurement so a model has to be fit to the data in order to obtain the film thickness and optical constants. To learn more about ellipsometry you can take a look at the [http://www.jawoollam.com/tutorial_1.html tutorial] provided by the J. A. Woollam Co.		Ellipsometry is an indirect measurement so a model has to be fit to the data in order to obtain the film thickness and optical constants. To learn more about ellipsometry you can take a look at the [http://www.jawoollam.com/tutorial_1.html tutorial] provided by the J. A. Woollam Co.

	Access to use the CompleteEASE software can be found using Remote Desktop connection to: DTU-8CC0321MFL		Access to use the CompleteEASE software can be found using Remote Desktop connection to: DTU-8CC0321MFL (you can only log on when you have the user competences in LabManager)