Specific Process Knowledge/Characterization/XRD/XRD Powder/Measurement tips: Difference between revisions
| Line 1: | Line 1: | ||
'''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/Specific_Process_Knowledge/Characterization/XRD/XRD_Powder click here]''' | '''Feedback to this page''': '''[mailto:labadviser@nanolab.dtu.dk?Subject=Feed%20back%20from%20page%20http://labadviser.nanolab.dtu.dk/index.php/Specific_Process_Knowledge/Characterization/XRD/XRD_Powder click here]''' | ||
[[image:Under_construction.png|200px]] | |||
This page is under construction | |||
==Choosing measurement parameters== | ==Choosing measurement parameters== | ||
Revision as of 12:54, 8 July 2022
Feedback to this page: click here
This page is under construction
Choosing measurement parameters
A detailed manual on the Aeris XRD is found on the wiki of the International Ocean Discovery Project. It has helpful hints on adjusting the hardware including choices on beam knife height and slit size. It also has some pictures from the XRDMP Creator software. Some info from there:
...Scanning at angles less than 5° 2θ you will need to lower the knife (anti scatter). .... at low angles you also need a narrower slit (which will reduce intensity but also the irradiated area)