Specific Process Knowledge/Characterization/Profiler: Difference between revisions
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====Use the right measurement settings for your sample==== | ====Use the right measurement settings for your sample==== | ||
Both the force setting and the scan speed are important: Too high force may compress a soft material like Al, Au or some polymers, while too low force may lead to the stylus "jumping" over features, especially if the scan speed is high. Too low scan speed may result in drift of the measurement and lots of noise while too high scan speed | Both the force setting and the scan speed are important: Too high force may compress a soft material like Al, Au or some polymers, while too low force may lead to the stylus "jumping" over features, especially if the scan speed is high. Too low scan speed may result in drift of the measurement and lots of noise while too high scan speed may mean that the stylus tip does not have time to reach the bottom of the features you are measuring (see the [http://labmanager.dtu.dk/d4Show.php?id=2346&mach=304 DektakXT manual], Figure 3 for details). | ||
A sharp vertical step is easiest to measure. If the step is gradual or the surface is very rough, it can be difficult to determine where to measure and how the scan should be leveled. | A sharp vertical step is easiest to measure. If the step is gradual or the surface is very rough, it can be difficult to determine where to measure and how the scan should be leveled. | ||