Specific Process Knowledge/Lithography/EBeamLithography/FirstEBL: Difference between revisions
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==General workflow== | ==General workflow== | ||
The general workflow of E-beam lithography on the JEOL 9500 system is summarized below. In order to optimize usage of the system steps 1 to | The general workflow of E-beam lithography on the JEOL 9500 system is summarized below. In order to optimize usage of the system steps 1 to 6 should all be done ahead of the booked session on the 9500 system. | ||
#Resist coating and baking | |||
#Application of discharge layer on substrates with >100 nm non-conducting films | |||
#Pattern preparation, possibly including Proximity Effect Correction | |||
#Jobdeck file (JDF) and schedule file (SDF) preparation | |||
#Job file compilation | |||
#Job file verification | |||
#Sample mounting | |||
#Cassette transfer | |||
#System calibration | |||
#Exposure | |||
#Cassette and sample unloading | |||
#Discharge layer removal | |||
#Development | |||
In the following we will look at each step in more detail and show step by step how to make a wafer/chip exposure. | In the following we will look at each step in more detail and show step by step how to make a wafer/chip exposure. | ||