Specific Process Knowledge/Characterization/Optical characterization: Difference between revisions
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==F10-RT reflectometer, transmitance, film thickness measurements == | ==F10-RT reflectometer, transmitance, film thickness measurements == | ||
[[image:F10-RT.JPG|275x275px|right|thumb|F10-RT: positioned in | [[image:F10-RT.JPG|275x275px|right|thumb|F10-RT: positioned in basement project lab] | ||
F10-RT is a combined reflectance and transmittance measurement system that can also use the reflectance measurements to get the film thickness of transparent thin films. This system combines fiber-optic spectrophotometry with material modeling software to provide an affordable tool for the measurement of reflectance, transmitance and film thickness. | F10-RT is a combined reflectance and transmittance measurement system that can also use the reflectance measurements to get the film thickness of transparent thin films. This system combines fiber-optic spectrophotometry with material modeling software to provide an affordable tool for the measurement of reflectance, transmitance and film thickness. | ||