Specific Process Knowledge/Characterization/Topographic measurement: Difference between revisions
m →Comparison of stylus profilers, optical profilers and AFMs at Nanolab: new Dektak position |
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|Can be done on a selected surface area | |Can be done on a selected surface area | ||
|Can be done on a line scan | |Can be done on a line scan | ||
|Recommended to use Dektak XTA | |Recommended to use P17 or Dektak XTA | ||
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