Specific Process Knowledge/Lithography/Pretreatment: Difference between revisions
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|align="left"|Silicon oxide || (x) || || x || (x) || | |align="left"| Silicon oxide || (x) || || x || (x) || | ||
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|align="left"| Glass (borofloat/pyrex) || x || || x || (x) || Dehydration before HMDS | |align="left"| Glass (borofloat/pyrex) || x || || x || (x) || Dehydration before HMDS is probably best | ||
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|align="left"| Fused silica || x || || x || (x) || Dehydration before HMDS | |align="left"| Fused silica || x || || x || (x) || Dehydration before HMDS is probably best | ||
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|align="left"| InGaAs || (x) || || || SurPass 3000 || | |||
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|align="left"| GaAs || (x) || || || SurPass 3000 || | |||
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|align="left"| GaP || (x) || || || ? || AR800-30 is being tested (leaves residue) | |||
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|align="left"| InP || (x) || || || ? || AR800-30 is being tested (leaves residue) | |||
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=HMDS= | =HMDS= | ||