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Specific Process Knowledge/Characterization/Profiler: Difference between revisions

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!style="background:silver; color:black;" align="left"|Posibilities  
!style="background:silver; color:black;" align="left"|Posibilities  
|style="background:LightGrey; color:black"|Confocal and interferometric profiling and reflectometry||style="background:WhiteSmoke; color:black"|
|style="background:LightGrey; color:black"|Confocal, interferometric and AI focus variation tophography and reflectometry||style="background:WhiteSmoke; color:black"|
*Standard microscope imaging
*Standard microscope imaging
*Confocal imaging
*Confocal imaging