Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy: Difference between revisions
Appearance
| Line 4: | Line 4: | ||
== Scanning electron microscopy in the cleanroom at DTU Nanolab== | == Scanning electron microscopy in the cleanroom at DTU Nanolab== | ||
The number of electron microscopes at DTU Nanolab is large. The five SEMs in building 346 cover a wide range of needs both in the cleanroom and outside: From fast in-process verification of different process parameters such as etch rates, step coverages or lift-off quality to ultra high resolution images on any type of sample intended for publication. | The number of electron microscopes at DTU Nanolab is large. The five SEMs in building 346 cover a wide range of needs both in the cleanroom and outside: From fast in-process verification of different process parameters such as etch rates, step coverages or lift-off quality to ultra high resolution images on any type of sample intended for publication. | ||