Jump to content

Specific Process Knowledge/Characterization/SEM: Scanning Electron Microscopy: Difference between revisions

Jmli (talk | contribs)
Jmli (talk | contribs)
Line 4: Line 4:


== Scanning electron microscopy in the cleanroom at DTU Nanolab==
== Scanning electron microscopy in the cleanroom at DTU Nanolab==
[[Specific_Process_Knowledge/Characterization/SEM_LEO|SEM LEO]]
 
The number of electron microscopes at DTU Nanolab is large. The five SEMs in building 346 cover a wide range of needs both in the cleanroom and outside: From fast in-process verification of different process parameters such as etch rates, step coverages or lift-off quality to ultra high resolution images on any type of sample intended for publication.  
The number of electron microscopes at DTU Nanolab is large. The five SEMs in building 346 cover a wide range of needs both in the cleanroom and outside: From fast in-process verification of different process parameters such as etch rates, step coverages or lift-off quality to ultra high resolution images on any type of sample intended for publication.