Specific Process Knowledge/Characterization/AFM: Atomic Force Microscopy: Difference between revisions
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[[Image:Nanoman cantilever AR5.jpg|right|thumb|AR5-NCHR tip<br /> (Aspect Ratio 5)]] | [[Image:Nanoman cantilever AR5.jpg|right|thumb|AR5-NCHR tip<br /> (Aspect Ratio 5)]] | ||
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*Free analysis software: For visualizing and analyzing AFM and Optical profiler files (Nanoman and Sensofar) [http://gwyddion.net Gwyddion] | *Free analysis software: For visualizing and analyzing AFM and Optical profiler files (Nanoman and Sensofar) [http://gwyddion.net Gwyddion] | ||
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*or you can get a SPIP license for free if you are connected one of the following institutes (Nanolab, Physics, Chemistry, Mechanics, Energikonvertering) , by contacting [mailto:jotri@adm.dtu.dk John Tandrup Riedel] | *or you can get a SPIP license for free if you are connected one of the following institutes (Nanolab, Physics, Chemistry, Mechanics, Energikonvertering) , by contacting [mailto:jotri@adm.dtu.dk John Tandrup Riedel] | ||
*[[Media:2014 Advanced AFM Applications Training Class_Image Quality&PeakForce Tapping.pdf|Bruker introduction to contact mode, tapping mode and peak force tapping mode + how to improve image quality]] | |||
*[[Media:AFM_Re-training_2015_v2.pdf]] - A bit about Peak Force Tapping mode, QNM mode, High Aspect ratio probe, booking rule | *[[Media:AFM_Re-training_2015_v2.pdf]] - A bit about Peak Force Tapping mode, QNM mode, High Aspect ratio probe, booking rule | ||
*[[/AFM Icon Acceptance|AFM Icon Acceptance 1 & 2 and overview of accessories and modes on the systems]] | *[[/AFM Icon Acceptance|AFM Icon Acceptance 1 & 2 and overview of accessories and modes on the systems]] | ||
*[[/Workspaces|What experiment/mode and probe to select]] | *[[/Workspaces|What experiment/mode and probe to select]] | ||
*[[/KPFM|KPFM measurements - work function]] | *[[/KPFM|KPFM measurements - work function]] | ||