Specific Process Knowledge/Characterization/XRD/XRD SmartLab: Difference between revisions
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Here are some results available: | Here are some results available: | ||
* Characterization of e-beam deposited Al thin films. | * Characterization of [[Specific_Process_Knowledge/Thin_film_deposition/Deposition_of_Aluminium/Al_Ebeam_evaporation_in_Temescal|e-beam deposited Al thin films]]. | ||
* Characterization of ALD deposited Al<sub>2</sub>O<sub>3</sub> and TiO<sub>2</sub> ultrathin layers. | * Characterization of ALD deposited Al<sub>2</sub>O<sub>3</sub> and TiO<sub>2</sub> ultrathin layers. | ||