Specific Process Knowledge/Characterization: Difference between revisions
m →Overview of characteristics and where to measure it: changed link since there are now two optical profilers |
m →Overview of characteristics and where to measure it: added that xrd can measure roughness |
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|align="left"| Surface roughness||||||x||x||x|||||||||||||||||||||||||||||| | |align="left"| Surface roughness||||||x||x||x||||||||||||||||x|||||||||||||| | ||
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