Specific Process Knowledge/Characterization/XRD/SLSII analysis: Difference between revisions
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**Chose X-ray target as Cu-Kα<sub>1</sub>. | **Chose X-ray target as Cu-Kα<sub>1</sub>. | ||
*Reflection information: | *Reflection information: | ||
**Select the layer for measurement. | |||
**Select the reflection for measurement, either by clicking on the simulation map or by typing in the number. Only allowed reflections in the chosen geometry are shown. | |||
**In the reflection box, infomation about the reflection, like 2θ |F|, |F|<sup>2</sup> and the incident and reflected angles are listed. | |||
**The five relevant axes for RSM configuration are listed below. | |||
**Numbers at the left side of the slider are offsets needed for the measurement. | |||
**To the right it is possible to chose if the measurement should be done relative to the offset or in absolute values. | |||
**For the relevant axes, the measurement range can be set. | |||
**At the bottom, show area will highlight the measurement area defined, and offsets can be send to the goniometer, while areas can be send to measurement configuration. | |||
==Texture== | ==Texture== | ||